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Terms
for subject
Microelectronics
containing
Proben
|
all forms
German
English
Abschrägung auf einer
Probe
bevel on sample
Abstand zwischen Objektiv und
Probe
lens-to-specimen spacing
Fase auf einer
Probe
bevel on sample
Positionierung einer Maske in bezug auf eine
Probe
positioning of a mask with respect to a sample
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